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Investigation of Interfacial Water Accumulation between Polypropylene Thin Film and Si Substrate by Neutron
Keisuke Shimokita1,2, Katsuhiro Yamamoto2, Noboru Miyata3
1Functional Base Products Sector, Nitto Denko Corporation, 18 Hirayama, Nakahara, Toyohashi, Aichi 441-3194, Japan.
Abstract:
We performed neutron reflectivity (NR) measurements of isotactic polypropylene (PP) thin films deposited on a Si substrate at the saturated vapor pressure of deuterated water to investigate interfacial water accumulation between the PP and metal surfaces in PP-based polymer/inorganic filler nanocomposites and metal/resin bonding materials. The PP thin films prepared on a Si substrate by a spin-coating technique were adequate as a model system for the PP/metal interface in these materials. A water-rich layer with a maximum water concentration of 0.5, which was considerably higher than those reported in previous studies of organic/inorganic interfaces, was observed within a width of approximately 3 nm at the interface under saturated vapor conditions. This could be attributed to the weak interaction between the PP thin film and the Si substrate. The pathway of moisture transport to the interfacial region was along the interface rather than through the PP film because the hydrophobic PP thin film does not entirely swell with water vapor.
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