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How high is a MoSe2monolayer?

Megan Cowie1, Rikke Plougmann1, Yacine Benkirane1

  • 1Department of Physics, McGill University, 3600 Rue University, Montréal, Québec H3A 2T8, Canada.

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|December 7, 2021
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Summary
This summary is machine-generated.

Determining the number of layers in transition metal dichalcogenides (TMDCs) like MoSe2 is crucial. This study reveals that atomic force microscopy (AFM) height measurements can vary significantly, impacting application-focused research.

Keywords:
2D materialsRaman spectroscopyTransition metal dichalcogenides (TMDCs)atomic force microscopy (AFM)kelvin probe force microscopy (KPFM)molybdenum diselenide (MoSe2)photoluminescence spectroscopy (PL)

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Condensed Matter Physics

Background:

  • Transition metal dichalcogenides (TMDCs) are vital for optoelectronics, photovoltaics, and photoelectrochemistry.
  • The performance of TMDCs depends heavily on their layer number.
  • Layer counting is typically performed post-fabrication using optical and atomic force microscopy (AFM) methods.

Purpose of the Study:

  • To investigate discrepancies in height measurements of exfoliated Molybdenum Diselenide (MoSe2) flakes.
  • To evaluate the reliability of different AFM methods for layer counting.
  • To highlight the influence of electrostatic forces on AFM height measurements.

Main Methods:

  • Photoluminescence spectroscopy
  • Raman spectroscopy
  • Three distinct Atomic Force Microscopy (AFM) techniques

Main Results:

  • Significant variations in MoSe2 flake height measurements were observed across different AFM methods.
  • Electrostatic forces were identified as a potentially misleading factor in AFM height measurements.
  • Discrepancies challenge the routine use of AFM for precise layer counting.

Conclusions:

  • Standard AFM height measurements may not accurately determine the layer number of MoSe2 flakes.
  • Careful consideration of measurement techniques and environmental factors is necessary for reliable TMDC characterization.
  • Further development of accurate and consistent layer-counting methodologies is required for TMDC applications.