Single-trial detection of EEG error-related potentials in serial visual presentation paradigm

Praveen K Parashiva1, A P Vinod1,2

  • 1Department of Electrical Engineering, Indian Institute of Technology Palakkad, India.

Summary

Researchers developed a new method to detect Error-Related Potentials (ErrPs) when image labels mismatch objects. This advance enables single-trial ErrP detection for potential brain-computer interface applications.

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