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Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
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In-plane InGaAs/Ga(As)Sb nanowire based tunnel junctions grown by selective area molecular beam epitaxy.

A Bucamp1, C Coinon1, S Lepilliet1

  • 1University of Lille, CNRS, Centrale Lille, University Polytechnique Hauts-de-France, UMR 8520-IEMN, F-59000 Lille, France.

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Summary

This study fabricates InGaAs/GaSb heterojunction tunnel diodes using selective area molecular beam epitaxy. Both radial and axial architectures demonstrate negative differential resistance with high peak current densities.

Keywords:
Esaki tunnel diodesin-plane nanowiremolecular beam epitaxyselective area growth

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Semiconductor Physics

Background:

  • In-plane heterojunction tunnel diodes are crucial for advanced electronic devices.
  • Understanding nanoscale effects on device performance is essential for optimization.

Purpose of the Study:

  • To fabricate and characterize InGaAs/GaSb heterojunction tunnel diodes using selective area molecular beam epitaxy.
  • To investigate two distinct architectures: radial nanowires and axial heterojunctions.
  • To analyze the impact of nanoscale phenomena on diode properties.

Main Methods:

  • Selective area molecular beam epitaxy (MBE) for fabricating InGaAs/GaSb heterojunctions.
  • Fabrication of radial InGaAs core/GaSb shell nanowires.
  • Fabrication of axial InGaAs/GaSb heterojunctions using template-assisted MBE.
  • Characterization of tunneling properties and negative differential resistance.

Main Results:

  • Demonstrated successful fabrication of in-plane InGaAs/GaSb heterojunction tunnel diodes.
  • Unveiled the influence of nanoscale strain relaxation and alloy fluctuations in radial nanowires.
  • Achieved precise nanoscale control over tunnel diode dimensions in axial heterojunctions via template-assisted MBE.
  • Observed negative differential resistance with large peak current densities in both architectures.

Conclusions:

  • Selective area MBE is a viable technique for fabricating high-performance InGaAs/GaSb tunnel diodes.
  • Nanoscale material properties significantly impact diode performance.
  • Template-assisted MBE offers scalable, precise control for nanoscale device fabrication.