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Updated: Oct 9, 2025

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
Fatigue Behavior of an AM50 Die-Casting Alloy Anodized by Plasma Electrolytic Oxidation
Kwangmin Choi1, Seungwon Kang2, Heon Kang3
1Department of Materials Science and Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Korea.
Abstract:
While an anodizing process is essential for magnesium alloys to be used under corrosive environments, it sometimes stimulates a fatigue fracture that initiates at the interface between the coating layer and the substrate. In this study, a plasma electrolyte oxidation (PEO) technique was employed to provide excellent adhesion between the anodizing layer and the AM50 die-cast by applying an extremely high dielectric discharge in an alkaline phosphate electrolyte, and its effect on corrosion and fatigue behaviors was investigated. The stress intensity factor at the fatigue limit was estimated to be 0.28 MPam0.5. The specimen anodized using the PEO technique exhibits enhanced strength and corrosion resistance compared to the unanodized counterpart. Furthermore, it shows a relative fatigue life in spite of the thick anodizing layer because the crack initiates from the interface, not from the pore near the interface.
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