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Published on: December 11, 2013
Enhancement of Sensitivity with High-Reflective-Index Guided-Wave Nanomaterials for a Long-Range Surface Plasmon
Leiming Wu1,2,3, Kai Che4, Yuanjiang Xiang5
1Institute of Advanced Photonics Technology, School of Information Engineering, Guangdong University of Technology, Guangzhou 510006, China.
Abstract:
A guided-wave long-range surface plasmon resonance (GW-LRSPR) sensor was proposed in this investigation. In the proposed sensor, high-refractive-index (RI) dielectric films (i.e., CH3NH3PbBr3 perovskite, silicon) served as the guided-wave (GW) layer, which was combined with the long-range surface plasmon resonance (LRSPR) structure to form the GW-LRSPR sensing structure. The theoretical results based on the transfer matrix method (TMM) demonstrated that the LRSPR signal was enhanced by the additional high#x2212;RI GW layer, which was called the GW-LRSPR signal. The achieved GW-LRSPR signal had a strong ability to perceive the analyte. By optimizing the low- and high-RI dielectrics in the GW-LRSPR sensing structure, we obtained the highest sensitivity (S) of 1340.4 RIU-1 based on a CH3NH3PbBr3 GW layer, and the corresponding figure of merit (FOM) was 8.16 × 104 RIU-1 deg-1. Compared with the conventional LRSPR sensor (S = 688.9 RIU-1), the sensitivity of this new type of sensor was improved by nearly 94%.
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