Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

24.5K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
24.5K
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

4.1K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
4.1K
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

1.2K
Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
1.2K
Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

309
In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
309

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Correlation between Orientation Spread and Ear Forming of As-Annealed AA5151 Aluminum Alloy.

Materials (Basel, Switzerland)·2023
Same author

Hydrothermal-aging-induced lattice distortion in yttria-stabilized zirconia using EBSD technique.

Micron (Oxford, England : 1993)·2021
Same author

Anisotropic Pinning-Effect of Inclusions in Mg-Based Low-Carbon Steel.

Materials (Basel, Switzerland)·2018
Same author

Resolution of transmission electron backscatter diffraction in aluminum and silver: Effect of the atomic number.

Ultramicroscopy·2018
Same author

A new method for detection of single nucleotide polymorphism in a female reproduction-associated gene, tmigd1, of Anas platyrhynchos using a strip biosensor with gold nanoparticles.

Poultry science·2018
Same author

Development and evaluation of oral Cancer quality-of-life questionnaire (QOL-OC).

BMC cancer·2018
Same journal

Correction: A method for supervoxel-wise association studies of age and other non-imaging variables from coronary computed tomography angiograms.

Scientific reports·2026
Same journal

Poly(bromophenol blue)/CoSn(OH)<sub>6</sub> cubic particles modified pencil graphite electrode for electrochemical determination of diphenhydramine.

Scientific reports·2026
Same journal

Dietary Chlorella, Spirulina, and acidifier modulate jejunal cytokine-related gene expression in broiler chickens.

Scientific reports·2026
Same journal

Perceived physical activity barriers in university students: associations with fatigue and eating behaviours.

Scientific reports·2026
Same journal

Refuge limitation structures habitat use in agricultural landscapes: evidence from Sunda pangolins.

Scientific reports·2026
Same journal

Lightweight stateless transaction verification with outsourced witness updates for UTXO blockchains.

Scientific reports·2026
See all related articles

Related Experiment Video

Updated: Oct 7, 2025

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

7.8K

Polynomial fitting method of background correction for electron backscatter diffraction patterns.

Yi-Yun Tsai1, Yi-Chen Pan1, Jui-Chao Kuo2

  • 1Department of Materials Science and Engineering, National Cheng-Kung University, Tainan, 701, Taiwan.

Scientific Reports
|January 11, 2022
PubMed
Summary
This summary is machine-generated.

A new polynomial fitting (PF) method effectively removes background noise from electron backscatter diffraction (EBSD) patterns. This technique enhances Kikuchi pattern clarity for analyzing challenging samples, improving materials characterization.

More Related Videos

AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells
06:03

AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells

Published on: June 23, 2023

599
Online Size-exclusion and Ion-exchange Chromatography on a SAXS Beamline
11:09

Online Size-exclusion and Ion-exchange Chromatography on a SAXS Beamline

Published on: January 5, 2017

17.5K

Related Experiment Videos

Last Updated: Oct 7, 2025

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

7.8K
AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells
06:03

AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells

Published on: June 23, 2023

599
Online Size-exclusion and Ion-exchange Chromatography on a SAXS Beamline
11:09

Online Size-exclusion and Ion-exchange Chromatography on a SAXS Beamline

Published on: January 5, 2017

17.5K

Area of Science:

  • Materials Science and Engineering
  • Analytical Chemistry
  • Crystallography

Background:

  • Raw electron backscatter diffraction (EBSD) signals contain Kikuchi patterns and undesirable background information.
  • Background features can offer insights into topography, composition, or diffraction contrast but hinder pattern indexing.
  • Existing methods struggle with non-conductive materials, low voltage, rough surfaces, and high-resolution EBSD (HR-EBSD) requirements.

Purpose of the Study:

  • To introduce and evaluate a novel polynomial fitting (PF) background correction method for EBSD.
  • To improve the quality of Kikuchi diffraction patterns, especially for challenging sample conditions.
  • To enable high-quality EBSD analysis in applications requiring clear patterns, such as HR-EBSD.

Main Methods:

  • Proposed a polynomial fitting (PF) algorithm for background correction in EBSD signals.
  • Evaluated Kikuchi pattern quality using pattern quality, Tenengrad variance, and spatial-spectral entropy.
  • Compared the PF method against pattern averaging and Fourier transform-based background correction techniques.

Main Results:

  • The PF method successfully extracted background images from blurred EBSD patterns.
  • Clear Kikuchi patterns were obtained even with coating layers and at low accelerating voltages (5 and 15 kV).
  • PF demonstrated superior performance in enhancing pattern clarity, contrast, and reducing noise compared to other methods.

Conclusions:

  • The proposed PF background correction method is effective for obtaining high-quality Kikuchi patterns.
  • This technique addresses limitations in analyzing non-conductive materials, rough surfaces, and low-voltage EBSD.
  • PF enables advanced EBSD applications requiring precise pattern analysis and high pattern quality.