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Updated: Oct 5, 2025

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
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Enlarged range of measurement method with strong noise resistance for dual-wavelength digital holography: erratum
Optics Letters
|February 1, 2022
Abstract:
We present an erratum to our Letter [Opt. Lett.46, 4694 (2021)10.1364/OL.432135]. This erratum corrects an unintended error in the labels of Figs. 5(h)-5(j). The corrections have no influence on the results and conclusions of the original Letter.
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