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Related Experiment Video

Updated: Oct 4, 2025

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

A method for cleaning flat punch diamond microprobe tips.

Joris Everaerts¹, Alejandra Slagter¹, Andreas Mortensen¹

¹Mechanical Metallurgy Laboratory, École Polytechnique Fédérale de Lausanne (EPFL), MXD 140 (Bâtiment MXD), Station 12, CH-1015 Lausanne, Switzerland.

Micron (Oxford, England : 1993)

|February 5, 2022

Summary

This summary is machine-generated.

Maintaining clean microprobe tips is essential for accurate micromechanical testing. This study introduces an effective focused ion beam method using a silicon ridge to scrape deposits from diamond tips, ensuring reliable data.

Keywords:

Diamond microprobe Flat punch In-situ Micromechanical testing Nanoindentation

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Last Updated: Oct 4, 2025

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Convergent Polishing: A Simple, Rapid, Full Aperture Polishing Process of High Quality Optical Flats & Spheres

Published on: December 1, 2014

Area of Science:

Materials Science
Nanotechnology
Mechanical Engineering

Background:

Microprobe tips are vital for in-situ micromechanical testing in electron microscopy.
Deposited material accumulation on tips compromises data reliability and reproducibility.
Existing literature on effective tip cleaning methods is limited.

Purpose of the Study:

To address the gap in knowledge regarding microprobe tip cleaning methods.
To present an effective and non-damaging technique for cleaning flat punch diamond microprobe tips.
To ensure reliable and reproducible results in micromechanical testing.

Main Methods:

Mechanical scraping using a focused ion beam (FIB)-milled silicon ridge.
Controlled removal of adhered deposits from diamond microprobe tip surfaces.
Implementation within a scanning electron microscope (SEM) environment.

Main Results:

Previous attempts using micro-brushes with silica or cementite were unsuccessful.
The FIB-milled silicon ridge effectively scraped off adhered deposits.
The developed method achieved complete and controlled cleaning without damaging the tip.

Conclusions:

Focused ion beam milling of a silicon ridge provides an effective cleaning solution for contaminated diamond microprobe tips.
This method offers a rapid, controlled, and damage-free approach for tip maintenance.
The technique enhances the reliability of in-situ micromechanical testing data obtained via electron microscopy.