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Microstrip sensor and methodology for the determination of complex anisotropic permittivity using perturbation
Hector-Noel Morales-Lovera1, Jose-Luis Olvera-Cervantes2, Aldo-Eleazar Perez-Ramos3
1Instituto Nacional de Astrofísica, Óptica y Electrónica, Puebla, Mexico.
Scientific Reports
|February 10, 2022
Summary
This study introduces a microstrip sensor and method to measure anisotropic material permittivity. The technique accurately determines both real and imaginary permittivity parts for various solid samples.
Area of Science:
- Electrical Engineering
- Materials Science
- Electromagnetics
Background:
- Characterizing the complex permittivity of anisotropic materials is crucial for microwave applications.
- Existing methods often lack precision or are complex for solid samples.
- Microstrip sensor technology offers a potential solution for efficient material characterization.
Purpose of the Study:
- To present a novel microstrip sensor and methodology for measuring the complex uniaxial permittivity of solid anisotropic samples.
- To enable the determination of both the real (dielectric constant) and imaginary (loss tangent) parts of permittivity.
- To validate the proposed technique using well-characterized anisotropic materials.
Main Methods:
- A microstrip sensor utilizing coupled line resonators with a cleft for sample placement was designed.
- The methodology correlates changes in even/odd resonance frequencies with the real part of permittivity (vertical/horizontal).
- Changes in the Q factor of even/odd modes are linked to the imaginary part of permittivity (vertical/horizontal).
Main Results:
- The sensor and methodology were successfully validated at 2.43 GHz.
- Anisotropic samples including printed PLA, Diclad 880, and RO4350B were characterized.
- Measurements were performed using known materials like RT5870, PTFE, and RO4003 for comparison.
Conclusions:
- The presented microstrip sensor and methodology provide an effective means to measure the complex uniaxial permittivity of solid anisotropic materials.
- This technique offers a reliable approach for characterizing materials relevant to microwave and RF applications.
- The successful verification demonstrates the practical applicability of the developed sensor and measurement approach.
