Related Experiment Video
Updated: Oct 4, 2025
Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM
Published on: January 23, 2013
Microstrip sensor and methodology for the determination of complex anisotropic permittivity using perturbation
Hector-Noel Morales-Lovera1, Jose-Luis Olvera-Cervantes2, Aldo-Eleazar Perez-Ramos3
1Instituto Nacional de Astrofísica, Óptica y Electrónica, Puebla, Mexico.
Abstract:
In this work, a sensor in microstrip technology and a methodology for measuring the real part and the imaginary part of the complex uniaxial permittivity of solid anisotropic samples are presented. The sensor is based on a pair of parallel lines coupled resonators and a cleft arranged in the coupling region which allows to hold the samples under test (SUTs). The proposed methodology relates the change in the even/odd resonance frequency with the real part of the permittivity in the vertical/horizontal direction, and the change in the Q factor of the even/odd mode with the imaginary part of the permittivity in the vertical/horizontal direction. The methodology was successfully verified with the characterization, at 2.43 GHz of anisotropic samples of printed PLA, Diclad 880, and RO4350B using the knowns materials: RT5870, PTFE and RO4003.
