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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Related Experiment Video

Updated: Oct 3, 2025

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

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Asperity level characterization of abrasive wear using atomic force microscopy.

Jack Walker1, Jamal Umer2, Mahdi Mohammadpour1

  • 1Wolfson School of Mechanical Engineering, Loughborough University, Loughborough LE11 3TU, UK.

Proceedings. Mathematical, Physical, and Engineering Sciences
|February 14, 2022
PubMed
Summary

This study introduces a nanoscale wear characterization method for steel, identifying atom attrition and elastoplastic ploughing. Wear transitions depend on material hardness and load, with Archard

Keywords:
abrasiveatomic force microscopefrictionnanoscalewear

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Area of Science:

  • Materials Science
  • Tribology
  • Nanotechnology

Background:

  • Steel AISI 52100 is a critical bearing material.
  • Understanding nanoscale wear mechanisms is essential for material performance.
  • Existing wear models may not fully capture nanoscale phenomena.

Purpose of the Study:

  • To develop and apply a nanoscale wear characterization method.
  • To identify and differentiate wear mechanisms in AISI 52100 steel.
  • To investigate the influence of load and hardness on nanoscale wear.

Main Methods:

  • Utilized an atomic force microscope (AFM) for high-resolution imaging.
  • Applied a novel nanoscale wear characterization technique.
  • Analyzed friction and 'degree of wear' to classify mechanisms.

Main Results:

  • Observed two distinct nanoscale wear mechanisms: atom attrition and elastoplastic ploughing.
  • Archard's Law of adhesion accurately describes elastoplastic ploughing at the nanoscale.
  • Identified a discontinuity in wear mechanisms related to load and removed volume, influenced by material hardness.

Conclusions:

  • The developed AFM method provides rapid nanoscale wear characterization.
  • Material hardness significantly influences the transition between wear mechanisms.
  • Further research is needed to scale nanoscale observations to macroscale contacts.