Mesh Analysis for AC Circuits
Susceptibility, Permittivity and Dielectric Constant
Parallel Resonance
Equivalent Resistance
Calculations of Electric Potential I
Equivalent Capacitance
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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Miroslav Joler1, Alex Noel Joseph Raj2, Juraj Bartolić3
1Department of Computer Engineering, Faculty of Engineering, University of Rijeka, 51000 Rijeka, Croatia.
This study introduces an efficient method to determine the relative permittivity of thin dielectric materials using a microstrip ring resonator (MRR). The technique achieves high accuracy for materials up to 2 mm thick.
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