Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.5K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.5K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Silicon Plasmonics for Enhanced Responsivity of Silicon Photodetectors in Deep-Ultraviolet Region.

Physical review letters·2025
Same author

Non-invasive nanoscale imaging of protein micro- and nanocrystals for screening crystallization conditions.

Journal of applied crystallography·2024
Same author

Development of a localized surface plasmon-enhanced electron beam-pumped nanoscale light source for electron beam excitation-assisted optical microscopy.

Microscopy (Oxford, England)·2024
Same author

High resolution imaging of ultrafine bubbles in water by Atmospheric SEM-CL.

Micron (Oxford, England : 1993)·2022
Same author

A Case of Intraocular Lymphoma Diagnosed by Subretinal Fluid Biopsy.

International medical case reports journal·2022
Same author

Development of a direct point electron beam exposure system to investigate the biological functions of subcellular domains in a living biological cell.

Micron (Oxford, England : 1993)·2022

Related Experiment Video

Updated: Oct 3, 2025

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.2K

High Spatial Resolution Ion Imaging by Focused Electron-Beam Excitation with Nanometric Thin Sensor Substrate.

Kiyohisa Nii1, Wataru Inami2, Yoshimasa Kawata1,2

  • 1Graduate School of Medical Photonics, Shizuoka University, 3-5-1 Johoku, Naka, Hamamatsu 432-8011, Japan.

Sensors (Basel, Switzerland)
|February 15, 2022
PubMed
Summary

Researchers developed a novel electron beam-based ion-imaging system. This system achieves 216 nm spatial resolution for pH sensing, significantly outperforming light-addressable potentiometric sensors (LAPS).

Keywords:
chemical imaging systemelectron-beam addressable potentiometric sensorelectron-beam-induced currenthigh spatial resolutionlight-addressable potentiometric sensorthin sensor substrate

More Related Videos

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

3.6K
Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

6.8K

Related Experiment Videos

Last Updated: Oct 3, 2025

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.2K
Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

3.6K
Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

6.8K

Area of Science:

  • Analytical Chemistry
  • Materials Science
  • Nanotechnology

Background:

  • Light-addressable potentiometric sensors (LAPS) are established for ion sensing.
  • Improving spatial resolution in LAPS systems remains a challenge.
  • Electron beam excitation offers potential for enhanced imaging capabilities.

Purpose of the Study:

  • To develop a high spatially-resolved ion-imaging system using focused electron beam excitation.
  • To investigate the feasibility of electron beam excitation for pH measurement.
  • To achieve superior spatial resolution compared to existing LAPS technologies.

Main Methods:

  • Designed a nanometric thin sensor substrate to enhance spatial resolution.
  • Utilized a focused electron beam as the excitation source, analogous to LAPS.
  • Evaluated spatial resolution using a photoresist on the ion-sensor substrate.

Main Results:

  • Achieved a Nernstian-like pH response with 53.83 mV/pH sensitivity.
  • Demonstrated a pH linearity of 96.15%.
  • Obtained a spatial resolution of 216 nm.

Conclusions:

  • The developed electron beam-based system offers significantly higher spatial resolution than traditional LAPS.
  • This technology advances high-resolution ion imaging and sensing capabilities.
  • The nanometric thin sensor substrate is crucial for achieving enhanced spatial resolution.