Critical assessment of machine-learned repulsive potentials for the density functional based tight-binding method: A

D Bissuel1, T Albaret1, T A Niehaus1

  • 1Univ Lyon, Université Claude Bernard Lyon 1, CNRS, Institut Lumière Matière, F-69622 Villeurbanne, France.

Summary

This study enhances the tight-binding method for silicon using machine learning, improving bulk properties but facing challenges with clusters. The approach offers a transferable many-body potential for materials simulations.

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