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High-Resolution Table-Top NEXAFS Spectroscopy.

Jonathan Holburg1, Matthias Müller1, Klaus Mann1

  • 1Institut für Nanophotonik Göttingen e.V., Hans-Adolf-Krebs-Weg 1, D-37077 Göttingen, Germany.

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A new table-top near-edge X-ray absorption fine structure (NEXAFS) spectroscopy system offers high resolution for analyzing thin samples. This advanced system achieves synchrotron-like spectral resolution, enabling detailed material analysis.

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Atomic and Molecular Physics

Background:

  • Synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy provides valuable insights into material electronic structure.
  • Existing table-top NEXAFS systems often lack the resolution and capabilities of large-scale synchrotron facilities.
  • Developing compact, high-performance NEXAFS systems is crucial for broader accessibility in scientific research.

Purpose of the Study:

  • To present a novel table-top near-edge X-ray absorption fine structure (NEXAFS) spectroscopy system.
  • To demonstrate a significantly improved spectral resolution and multi-edge analysis capability in a compact setup.
  • To validate the system's performance against established synchrotron-based measurements.

Main Methods:

  • Development of a table-top soft X-ray source utilizing a picosecond laser-induced plasma in a pulsed krypton gas jet.
  • Integration of a high-resolution spectrometer capable of photon energies from 250 to 1000 eV.
  • Characterization of K- and L-absorption edges of various elements (C, Ca, O, Fe, Ni, Cu) in different sample types.

Main Results:

  • Achieved a spectral resolution of E/ΔE = 1535 at 430 eV, comparable to synchrotron setups.
  • Demonstrated stable and nearly debris-free operation of the laser-induced plasma soft X-ray source.
  • Obtained excellent agreement between the table-top system's spectra and synchrotron-based spectra for multiple elements.

Conclusions:

  • The developed table-top NEXAFS system provides high-resolution spectroscopic analysis capabilities.
  • This compact system offers a viable and accessible alternative to synchrotron radiation sources for NEXAFS studies.
  • The system's performance enables detailed investigation of electronic structures in various materials.