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Tri-wavelength simultaneous ESPI for 3D micro-deformation field measurement
Applied Optics
|February 24, 2022
Summary
This study introduces a novel Electronic Speckle Pattern Interferometry (ESPI) system for simultaneous 3D deformation measurement. The system accurately captures all three displacement components and in-plane strain fields using three lasers and a 3CCD camera.
Area of Science:
- Optical Metrology
- Experimental Mechanics
Background:
- Electronic Speckle Pattern Interferometry (ESPI) is a key technique for micro-deformation analysis.
- While ESPI can measure 3D displacement, simultaneous measurement of full 3D deformation fields remains a challenge.
Purpose of the Study:
- To develop and demonstrate an ESPI system for simultaneous measurement of all three displacement components and in-plane strain fields.
- To address the limitations of existing ESPI methods in capturing comprehensive 3D deformation.
Main Methods:
- Implementation of an ESPI system with three sub-interferometers.
- Utilization of a 3CCD color camera and three lasers with distinct wavelengths for independent interferogram generation.
- Incorporation of a specialized shifting stage for simultaneous phase shifting across sub-interferometers.
Main Results:
- Successful simultaneous acquisition of interferograms for all three displacement components.
- Demonstration of the system's capability to measure in-plane strain fields.
- Validation of the system's utility through color separation and experimental measurements.
Conclusions:
- The presented ESPI system enables simultaneous measurement of 3D displacement and in-plane strain fields.
- The innovative setup overcomes previous limitations in comprehensive 3D deformation analysis.
- The system shows significant potential for advanced micro-deformation studies.
