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Aperture measurement based on a conic invariant.

Ying Kou, Longfei Zhang, Siyuan Liu

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    |February 24, 2022
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    Summary
    This summary is machine-generated.

    This study presents a low-cost method for accurately measuring aperture diameter using conic invariants derived from ellipse fitting. This technique enables precise in situ detection for various applications.

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    Area of Science:

    • Optical metrology
    • Geometric optics
    • Image processing

    Background:

    • Accurate measurement of aperture diameter is crucial for optical systems.
    • Existing methods may be costly or lack in situ capabilities.
    • Developing efficient and universally applicable measurement techniques is essential.

    Purpose of the Study:

    • To develop a cost-effective and universally applicable method for in situ aperture diameter measurement.
    • To utilize conic invariants derived from ellipse fitting for enhanced accuracy.
    • To establish a robust image processing pipeline for aperture edge detection and analysis.

    Main Methods:

    • Establishing a world coordinate system and camera calibration for coordinate transformation.
    • Employing an improved Canny algorithm for sub-pixel aperture edge detection.
    • Projecting detected edge points onto the aperture surface using coordinate transformation.
    • Performing ellipse geometric fitting on the projected edge data to obtain the conic invariant.

    Main Results:

    • Successfully obtained the conic invariant of the aperture by fitting ellipses to the aperture edge.
    • Demonstrated the projection of sub-pixel aperture edge coordinates onto the aperture surface.
    • Validated the use of the conic invariant for accurate aperture diameter measurement on a test bench.

    Conclusions:

    • The proposed method offers a low-cost, universally applicable, and in situ solution for aperture diameter measurement.
    • The integration of improved Canny algorithm, coordinate transformation, and ellipse fitting provides a robust approach.
    • The conic invariant serves as a reliable parameter for precise optical metrology applications.