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Experimental verification of full-field accuracy in stereo-DIC based on the ESPI method
Applied Optics
|February 24, 2022
Summary
This study introduces a novel method merging stereo-digital image correlation (DIC) and electronic speckle pattern interferometry (ESPI) for precise 3D deformation analysis. The technique validates stereo-DIC measurements and enhances ESPI capabilities for large-scale applications.
Area of Science:
- Optical Measurement Techniques
- Experimental Mechanics
- Metrology
Background:
- Accurate full-field displacement measurement is crucial in experimental mechanics.
- Digital Image Correlation (DIC) and Electronic Speckle Pattern Interferometry (ESPI) are powerful optical methods.
- Integrating DIC and ESPI can overcome individual limitations and enhance measurement capabilities.
Purpose of the Study:
- To propose and validate a method for merging stereo-DIC and ESPI data through camera calibration.
- To verify the accuracy of full-field out-of-plane displacements measured by stereo-DIC.
- To enable high-precision 3D deformation measurements by unifying coordinate systems of multiple ESPI systems.
Main Methods:
- Camera calibration to merge stereo-DIC and ESPI data.
- Cantilever beam test to evaluate full-field out-of-plane displacement accuracy.
- Analysis of mean absolute error and Root Mean Square Error (RMSE) for displacement measurements.
Main Results:
- Stereo-DIC achieved high accuracy with RMSE of 1.08 µm (60 mm FOV) and 1.48 µm (120 mm FOV).
- Calibration errors influenced displacement accuracy, showing non-uniform distribution at 60 mm FOV.
- The method successfully traced stereo-DIC accuracies to laser wavelength, confirming data integrity.
Conclusions:
- The proposed merging method accurately verifies stereo-DIC measurements and determines rigid-body displacement for ESPI.
- This integration allows for high-precision 3D deformation measurements over large ranges by unifying multiple ESPI systems.
- The technique offers a robust solution for advanced experimental mechanics and metrology applications.
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