Self-reference frequency response characterization of photodiode chips based on photonic sampling and microwave...

Area of Science:

• Photonics and Microwave Engineering
• Semiconductor Device Testing

Background:

• Accurate characterization of photodiode frequency response is crucial for high-speed optical systems.
• Existing methods often require complex setups and external calibration standards.

Purpose of the Study:

• To develop a self-reference on-chip testing method for photodiode frequency response.
• To eliminate the need for external electro-optical transducer standards in chip evaluation.

Main Methods:

• Utilizing half-frequency photonic sampling for self-reference extraction of combined chip and network responses.
• Employing microwave de-embedding with short-open-load-device (SOLD) termination for on-chip calibration.
• Characterizing transmission loss and impedance mismatch of adapter and receiver networks.

Main Results:

• Successful demonstration of a self-reference on-chip testing methodology.
• Obtained frequency response characteristics of photodiode chips without external standards.
• Validated the effectiveness of photonic sampling and microwave de-embedding for on-chip calibration.

Conclusions:

• The proposed method offers a simplified and efficient approach for photodiode performance monitoring.
• This technique is highly beneficial for on-chip testing and evaluation in integrated photonic circuits.
• The self-reference capability reduces complexity and cost in photodiode characterization.