Aliasing
Electronic Distance Measuring Instruments
Scanning Electron Microscopy
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Updated: Oct 1, 2025

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
Published on: January 3, 2016
Heedong Goh1,2, Andrea Alù1,2,3
1Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, USA.
Engineered microstructures enable compact analog computing by manipulating wave interactions. This approach offers a low-energy, ultrafast method for data processing and solving complex equations using scattered fields.
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