Related Experiment Video
Updated: Oct 1, 2025

Author Spotlight: Technologies and Challenges in Elemental Analysis of Food Samples
Published on: December 22, 2023
Analytical potential of total reflection X-ray fluorescence (TXRF) instrumentation for simple determination of major
E Marguí1, I Queralt2, D Andrey3
1Department of Chemistry, University of Girona, C/M. Aurèlia Capmany, 69, 17003 Girona, Spain.
Abstract:
In this contribution, the analytical potential of total reflection X-ray fluorescence (TXRF) instrumentation has been evaluated for the determination of major and trace elements in milk powder. TXRF allows the possibility of direct analysis of solid suspensions without the need for a digestion process and therefore it can be a potential analytical candidate for simple and cost-effective analysis. A detailed study to select sample preparation and measurements conditions was carried out. Different quantification approaches (including internal standardization and empirical calibration) were also tested. Finally, the developed TXRF methods (W anode) were validated by a strict comparison with the data from the reference methods on a set of twenty-three samples using robust statistics. Results showed that acceptable results can be obtained for K, Ca, Fe and Zn determination if using adequate calibration approaches. Otherwise, only screening results can be obtained for light elements (P and Cl) in milk powder samples.
Related Concept Videos
Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Overview
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences
Atomic Absorption Spectroscopy: Lab
Solutions containing organic solvents, such as low-molecular-mass alcohols, esters, or ketones, enhance absorbances by increasing...
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview
The ATR process begins by directing a beam...
X-ray Diffraction of Biological Samples
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...

