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Quantified density of performance-degrading near-interface traps in SiC MOSFETs

Mayank Chaturvedi1,2, Sima Dimitrijev3,4, Daniel Haasmann3,4

  • 1Queensland Micro- and Nanotechnology Centre, Griffith University, Brisbane, QLD, 4111, Australia. mayank.chaturvedi@griffithuni.edu.au.

Scientific Reports
|March 9, 2022
PubMed

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