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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Atomic Absorption Spectroscopy: Overview01:27

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Atomic absorption spectroscopy (AAS) is a technique used to analyze elements by measuring electromagnetic radiation (EMR) absorbed by atoms, which causes them to transition to a higher-energy orbit. The most crucial step in AAS is atomization, where the analyte is converted into gas-phase atoms, typically through a flame or furnace. Some of these atoms become thermally excited in the flame, while most remain in the ground state.
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Atomic Emission Spectroscopy: Lab01:29

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
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Atomic Absorption Spectroscopy: Radiation and Light Sources01:13

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Atomic absorption spectroscopy (AAS) relies on the Beer-Lambert law, which requires that the radiation source emits a narrow range of wavelengths to match the absorption characteristics of the analyte atom. The primary criteria for choosing an appropriate radiation source in AAS is to provide a precise and intense emission at specific wavelengths that will allow accurate detection of the analyte.
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Scanning Electron Thermal Absorbance Microscopy for Light Element Detection and Atomic Number Analysis.

Ching-Che Lin1, Shih-Ming Wang1,2, Bo-Yi Chen1

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This study introduces a new thermal absorbance measurement platform for scanning electron microscopy (SEM). This tool enables accurate atomic number analysis of nanoscale materials, especially light elements.

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Area of Science:

  • Nanoscale science and technology
  • Materials science and engineering
  • Electron microscopy and metrology

Background:

  • Electron microscopy excels at measuring nanoscale thermal transport properties.
  • The application of thermal metrology for material analysis, particularly atomic number determination, remains unexplored.
  • Existing methods for nanoscale material analysis often face limitations in efficiency and signal quality.

Purpose of the Study:

  • To introduce a novel direct thermal absorbance measurement platform integrated into a scanning electron microscope (SEM).
  • To demonstrate the utility of this platform for atomic number (Z) analysis at the nanoscale.
  • To establish thermal absorbance as a complementary signal to backscattered electrons for material characterization.

Main Methods:

  • Development and implementation of a direct thermal absorbance measurement system within an SEM.
  • Utilizing the thermal absorbance signal for nanoscale material analysis.
  • Comparing the performance of thermal absorbance with backscattered electron signals.

Main Results:

  • The thermal absorbance signal is complementary to backscattered electron signals but offers superior collection efficiency and signal-to-noise ratio.
  • Successful detection of light elements and compounds using the platform, even at low SEM acceleration voltages.
  • Quantitative atomic number (Z) analyses were achieved, showing agreement with simulation data.

Conclusions:

  • Direct thermal absorbance measurement in SEM is a viable and effective method for nanoscale material analysis.
  • This platform provides a powerful new tool for SEM, particularly for analyzing thin films, light elements/compounds, and biological samples.
  • The high efficiency and signal quality make it ideal for applications requiring precise atomic number determination at the nanoscale.