One-Degree-of-Freedom System
Absolute Motion Analysis- General Plane Motion
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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Constantin Schempp1,2, Stefan Schulz1
1Physik Instrumente (PI) GmbH & Co. KG, Auf der Roemerstraße 1, 76228 Karlsruhe, Germany.
This study introduces a direct pose measurement system for parallel mechanisms using cameras and fiducial tags. This method overcomes limitations of indirect measurements, improving accuracy for high-precision robotics.
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