Superresolution Microscopy of Optical Fields Using Tweezer-Trapped Single Atoms

Area of Science:

• Atomic physics
• Optical microscopy
• Quantum sensing

Background:

• Optical field measurements are crucial in various scientific disciplines.
• Conventional microscopy techniques face limitations in spatial resolution due to diffraction.
• Subwavelength optical field characterization requires advanced imaging methods.

Purpose of the Study:

• To develop a novel scanning probe microscope utilizing single trapped atoms.
• To achieve subwavelength spatial resolution for optical field measurements.
• To demonstrate the capability of atomic sensors for high-resolution optical imaging.

Main Methods:

• Employing single trapped Rubidium-87 (⁸⁷Rb) atoms as scanning probes.
• Detecting atomic fluorescence to determine the ac Stark shift induced by local optical fields.
• Measuring changes in fluorescence rate to map optical field intensity and phase.
• Benchmarking the microscope using standing-wave Gaussian modes in a Fabry-Pérot resonator.

Main Results:

• Achieved a spatial resolution of 300 nm, surpassing the diffraction limit of the detected light wavelength (780 nm).
• Successfully measured optical fields at 1560 nm and 781 nm wavelengths.
• Demonstrated super-resolution imaging of optical standing waves.
• Enhanced sensitivity to short length scale features by utilizing the force exerted by optical fields on atoms.

Conclusions:

• Single trapped atoms provide a versatile platform for high-resolution optical field measurements.
• The atomic scanning probe microscope offers a pathway to overcome classical diffraction limits in imaging.
• This technique has potential applications in nanoscale optics, quantum information, and materials science.