Scanning Electron Microscopy
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Atomic Force Microscopy
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Gen Liu1, Luzhen Hao1, Hao Li1
1Tianjin International Center for Nanoparticles and Nanosystems, Tianjin University, Tianjin 300072, P. R. China.
This study enhances scanning electrochemical cell microscopy (SECCM) for nanoscopic material analysis. The new method achieves high-resolution imaging of topography and electrochemical activity, enabling direct structure-activity correlations.
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