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Intelligent detection of hard seeds of snap bean based on hyperspectral imaging
Jiaying Wang1, Laijun Sun1, Guojun Feng2
1School of Electronic Engineering (Heilongjiang University), Harbin, Heilongjiang, China.
Abstract:
As a common problem in snap beans, hard seed has seriously affected the large-scale industrial planting and yield of snap bean. To realize accurate, quick and non-destructive identifying the hard seeds of snap bean is of great significance to avoiding the effects of hard seeds on germination and growth. This research was based on hyperspectral imaging (HSI) to achieve accurate detection of hard seeds of snap bean. This study obtained the characteristic spectra from the hyperspectral image of a single seed, and then combined the synthetic minority over-sampling technique (SMOTE) and Tomek links to balance the numbers of hard and non-hard seed samples. The characteristic wavelengths were extracted from the average spectrum. Then the average spectrum was processed by first derivative (1D). After that, the characteristic wavelengths could be extracted using successive projections algorithm (SPA). Finally, a radial basis function-support vector machine (RBF-SVM) model was established to realize the intelligent detection of hard seeds, and the detection accuracy rate reached 89.32%. The research results showed that HSI technology could achieved accurate, fast and non-destructive testing of the hard seeds of snap bean, which is of great significance to the large-scale and standardized planting of snap bean and increase the yield per unit area.
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