Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Three-Dimensional Analysis of Strain01:29

Three-Dimensional Analysis of Strain

311
Three-dimensional strain analysis is crucial for understanding how materials deform under stress, particularly in elastic, homogeneous materials. This method employs principal stress axes to simplify complex stress states into more understandable forms. Subjected to stress, a small cubic element within a material either expands or contracts along these axes, transforming into a rectangular parallelepiped. This transformation effectively illustrates the material's deformation. The principal...
311
Atomic Force Microscopy01:08

Atomic Force Microscopy

3.6K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.6K
Measurements of Strain01:27

Measurements of Strain

2.3K
Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...
2.3K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Tiny Bubbles: Combined HR(S)TEM and 4D-STEM Analysis of Sub-Nanometer He Bubbles in Au.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2025
Same author

Revealing Nanoscale Solute-Rich Clusters in Bulk Metallic Glasses by Atom Probe Tomography.

Small methods·2025
Same author

Dispersion-tunable low-loss implanted spin-wave waveguides for large magnonic networks.

Nature materials·2025
Same author

Reversible Piezochromism of Platinum(II) and Palladium(II) Dimers in Molecular Single Crystals.

Nano letters·2025
Same author

Element-Specific Ultrafast Lattice Dynamics in Monolayer WSe<sub>2</sub>.

Nano letters·2024
Same author

Understanding the origin of lithium dendrite branching in Li<sub>6.5</sub>La<sub>3</sub>Zr<sub>1.5</sub>Ta<sub>0.5</sub>O<sub>12</sub> solid-state electrolyte via microscopy measurements.

Nature communications·2024

Related Experiment Video

Updated: Sep 28, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moir&#233; Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

12.4K

Quantitative Strain and Topography Mapping of 2D Materials Using Nanobeam Electron Diffraction.

Julian Sickel1, Marcel Asbach1, Christoph Gammer2

  • 1Physikalisches Institut, WWU Münster, Wilhelm-Klemm-Straße 10, 48149Münster, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|April 1, 2022
PubMed
Summary

Researchers developed a new method to measure strain and topography in 2D materials using scanning nanobeam electron diffraction (NBED). This technique accurately quantifies local curvature and strain, crucial for understanding material properties.

Keywords:
2D materialsNBEDmonolayerstraintopography

More Related Videos

Production of a Strain-Measuring Device with an Improved 3D Printer
06:17

Production of a Strain-Measuring Device with an Improved 3D Printer

Published on: January 30, 2020

6.3K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K

Related Experiment Videos

Last Updated: Sep 28, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moir&#233; Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

12.4K
Production of a Strain-Measuring Device with an Improved 3D Printer
06:17

Production of a Strain-Measuring Device with an Improved 3D Printer

Published on: January 30, 2020

6.3K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K

Area of Science:

  • Materials Science
  • Nanotechnology
  • Condensed Matter Physics

Background:

  • Two-dimensional (2D) materials possess non-flat topography, leading to inherent strain.
  • Local curvature and strain significantly impact mechanical, optical, and electrical properties.
  • Distinguishing between curvature and strain effects requires advanced measurement techniques.

Purpose of the Study:

  • Introduce a novel, robust method for quantitative strain and topography measurement in 2D materials.
  • Achieve nanometer resolution for precise analysis.
  • Enable disentanglement of strain from local sample slope.

Main Methods:

  • Utilize scanning nanobeam electron diffraction (NBED).
  • Reconstruct reciprocal lattice rod locations and orientations from diffraction spot positions at two different sample tilts.
  • Simultaneously retrieve local strain and slope information.

Main Results:

  • Demonstrate theoretical, simulated, and experimental validation of the method.
  • Successfully recovered slope, height, tensile strain, and angular strain for MoS2 monolayers with high accuracy (absolute difference < 0.2% and 0.2°).
  • Provided experimental proof of concept on a suspended WSe2 monolayer.

Conclusions:

  • The developed NBED-based method accurately quantifies strain and topography in 2D materials.
  • This technique effectively separates strain from sample slope, overcoming limitations of previous methods.
  • The findings offer a powerful tool for characterizing 2D materials and understanding their property-strain relationships.