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Sifting fluctuation scattering from microtextured samples

Antonio Cervellino1

  • 1Swiss Light Source, Paul Scherrer Institut, Forschungstrasse 111, 5232 Villigen Switzerland.

Iucrj
|April 4, 2022
PubMed

Keywords:
X-ray free-electron lasersXFELscorrelated fluctuationscrystalline domainsdynamical studiesfluctuation scatteringintensity correlationspair-angle distribution functionspreferred orientation

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