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Exfoliation of Al-Residual Multilayer MXene Using Tetramethylammonium Bases for Conductive Film Applications
Emi Saita1, Masaki Iwata2, Yuki Shibata2
1Department of Electronics, Graduate School of Engineering, Nagoya University, Nagoya, Japan.
Abstract:
This study describes the concise exfoliation of multilayer Ti3C2T MXene containing residual aluminum atoms. Treatment with tetramethylammonium base in a co-solvent of tetrahydrofuran and H2O produced single-layer Ti3C2T , which was confirmed via atomic force microscopy observations, with an electrical conductivity 100+ times that of Ti3C2T prepared under previously reported conditions. The scanning electron microscopy and X-ray diffraction measurements showed that the exfoliated single-layer Ti3C2T MXenes were reconstructed to assembled large-domain layered films, enabling excellent macroscale electric conductivity. X-ray photoelectron spectroscopy confirmed the complete removal of residual Al atoms and the replacement of surface fluorine atoms with hydroxy groups. Using the exfoliated dispersion, a flexible transparent conductive film was formed and demonstrated in an electrical application.
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