Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme

Hong Duc Nguyen1, Rizhao Cai1, Heng Zhao1

  • 1School of Electrical & Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore.

Micromachines
|April 23, 2022
PubMed
Summary

This study introduces a Task-Driven Cropping (TDC) scheme to improve deep learning-based object detection in X-ray security imaging. TDC enhances detection accuracy and efficiency for luggage inspection by focusing on relevant image regions.