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Updated: Sep 25, 2025

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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Correction: Tuning the charge carrier mobility in few-layer PtSe2 films by Se : Pt ratio
Jana Hrdá1,2, Valéria Tašková1, Tatiana Vojteková1,3
1Institute of Electrical Engineering, SAS Dúbravská cesta 9 84104 Bratislava Slovakia michaela.sojkova@savba.sk.
RSC Advances
|May 2, 2022
Abstract:
[This corrects the article DOI: 10.1039/D1RA04507E.].

