Simultaneous Corneal Topography and Epithelial Thickness Mapping from a Single Measurement Using Optical Coherence...

Area of Science:

• Ophthalmology
• Medical Imaging
• Corneal Science

Background:

• Corneal epithelial thickness mapping (ETM) is crucial for diagnosing and monitoring various eye conditions.
• Simultaneous measurement of ETM and corneal topography can provide a more complete understanding of corneal health.

Purpose of the Study:

• To evaluate the performance of the REVO NX OCT device for corneal epithelial thickness mapping (ETM).
• To demonstrate the simultaneous measurement of ETM and corneal topography using the REVO NX device.

Main Methods:

• 137 eyes were scanned using the REVO NX OCT device.
• ETMs and corneal topography maps were reconstructed from a single measurement.
• Corneal topography was also performed using Pentacam for comparison.

Main Results:

• The REVO NX device demonstrated high repeatability and reproducibility for ETMs, with an Intraclass Correlation Coefficient (ICC) of 0.95 for the central sector.
• The coefficient of variation (CoV) for repeatability was ≤1.55%, slightly higher than some other devices.
• Superior corneal quadrants were found to be thinner than inferior quadrants.

Conclusions:

• REVO NX OCT provides reliable and reproducible ETMs in normal eyes.
• Simultaneous ETM and topography measurements from a single OCT scan eliminate the need for reciprocal centration, ensuring accurate point-to-point correlation.
• This integrated approach offers a more complete assessment of corneal pathologies.