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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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The shearing strain represents a cubic element's angular change when subjected to shearing stress. This type of stress can transform a cube into an oblique parallelepiped without influencing normal strains. The cubic element experiences a significant transformation when exposed solely to shearing stress. Its shape alters from a perfect cube into a rhomboid, clearly demonstrating the effect of shearing strain. The degree of this strain is considered positive if it reduces the angle between...
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As discussed in previous lessons, strain energy in a material is the energy stored when it is elastically deformed, a concept crucial in materials science and mechanical engineering. This energy results from the internal work done against the cohesive forces within the material. When a material undergoes shearing stress and corresponding shearing strain, the strain energy density, which is the energy stored per unit volume, is calculated. Within the elastic limit, where the stress is...
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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
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German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
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Related Experiment Video

Updated: Sep 24, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Shear displacement gradient in X-ray Bragg coherent diffractive imaging.

Oleg Gorobtsov1, Andrej Singer1

  • 1Department of Materials Science and Engineering, Cornell University, 418 Thurston Hall, Ithaca, NY 14853, USA.

Journal of Synchrotron Radiation
|May 5, 2022
PubMed
Summary
This summary is machine-generated.

Bragg coherent X-ray diffractive imaging reveals crystal structure. New analysis of displacement gradients provides deeper insights into strain, stress, and dislocation motion in nanocrystals.

Keywords:
coherent X-ray imagingcrystal defectsnanocrystals

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Area of Science:

  • Materials Science
  • Crystallography
  • Nanotechnology

Background:

  • Bragg coherent X-ray diffractive imaging (CXDI) is a powerful technique for 3D crystal structure determination at the nanoscale.
  • Phase retrieval in CXDI yields atomic displacement, from which normal strain is derived as a proxy for structural changes.

Purpose of the Study:

  • To explore the utility of the perpendicular component of the displacement gradient in CXDI analysis.
  • To demonstrate how this additional information can enhance understanding of nanocrystal behavior, particularly concerning dislocations.

Main Methods:

  • Utilizing Bragg coherent X-ray diffractive imaging (CXDI).
  • Applying phase retrieval to extract atomic displacement information.
  • Analyzing both parallel and perpendicular components of the displacement gradient.

Main Results:

  • The perpendicular displacement gradient component provides crucial information beyond normal strain.
  • This component enables estimation of external stresses acting on nanocrystals.
  • It aids in locating surface dislocations and predicting their motion during in situ experiments.

Conclusions:

  • The perpendicular displacement gradient is a valuable, underutilized metric in CXDI.
  • Incorporating this component significantly expands the analytical capabilities of CXDI for studying nanocrystals with mobile dislocations.
  • This approach offers new possibilities for in situ stress and dislocation dynamics analysis.