Temperature dependence of piezo- and ferroelectricity in ultrathin P(VDF-TrFE) films
Jun Qian1, Sai Jiang1, Qijing Wang1
1National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University Nanjing 210093 P. R. China yli@nju.edu.cn.
Abstract:
The polymer poly(vinylidene fluoride-co-trifluoroethylene) (P(VDF-TrFE)) is highly desirable for piezoelectric and ferroelectric functional applications owing to its considerable electromechanical activity and reliable electrical polarization. However, a clear understanding of the effect of the thermal annealing on the electromechanical behavior and polarization nature of ultrathin crystalline P(VDF-TrFE) films is severely lacking. Here we report the thermally induced structural reorganization, and piezo- and ferroelectric features in the ultrathin P(VDF-TrFE) films. On applying a 40 °C annealing treatment, the polarization-patterned electrostrictive strain reaches the highest value of ∼53.7 pm. Besides, the ultrathin film exhibits a highly ordered antiparallel dipole alignment, the highest local piezoelectric activity, and an improved polarization relaxation time. The optimum film properties are achieved owing to a high degree of polymer chains oriented parallel to the substrate plane. Our results can reveal a promising avenue for nano-electro-mechanical and nano-ferroelectric electronic applications using ultrathin P(VDF-TrFE) films.
More Related Videos
10:40A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
08:00Chemical Synthesis of Porous Barium Titanate Thin Film and Thermal Stabilization of Ferroelectric Phase by Porosity-Induced Strain
Published on: March 27, 2018
