Electron ptychography dose reduction using Moiré sampling on periodic structures
Related Experiment Video
Updated: Sep 20, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Mohammad Taghi Hashemi1, Alexandre Pofelski1, Gianluigi A Botton2
1Department of Materials Science and Engineering, McMaster University, 1280 Main Street West, Hamilton, ON L8S 4L7, Canada.
Abstract:
Electron ptychography has been implemented in Scanning Transmission Electron Microscopy (STEM) to study materials with higher spatial resolution. High electron dose imposed by data redundancy requirement in electron ptychography is detrimental to the samples well-suited for ptychography, i.e., thin samples. In this work, we demonstrate a smart (Moiré) sampling strategy which allows dose reduction by orders of magnitude on periodic crystalline samples.
More Related Videos
Related Concept Videos
¹³C NMR: Distortionless Enhancement by Polarization Transfer (DEPT)
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

