The Electrical Response of Real Dielectrics: Using the Voltage Ramp Method as a Straightforward Diagnostic Tool for...

An experimental method exploiting the capacitive response of most materials is here revised. The procedure called the "Voltage Ramp Method" (VRM) is based on applying proper voltage ramp cycles over time and measuring electrical current intensity flowing through the material sample. In the case of an ideal capacitor, a current plateau should be easily measured, and the capacitance value precisely determined. However, most media, e.g., semiconductors and insulating polymers, show dielectric absorption and hence electric leakage effects. Therefore, the VRM method allows simultaneous determination of their equivalent capacitance and resistance. Some case studies are discussed as concerning the application of VRM to both standard and actual media. A figure of merit of the method is the percentage difference between 2.5% and 1.5% with respect to the nominal values of a commercial capacitor and resistor, respectively. The simulation modeling of the material electrical response is compared to the experimental data also on polymer nanocomposites suitable for energy harvesting.