A Novel Key Features Screening Method Based on Extreme Learning Machine for Alzheimer's Disease Study.

Jia Lu1, Weiming Zeng1, Lu Zhang2

  • 1Laboratory of Digital Image and Intelligent Computation, Shanghai Maritime University, Shanghai, China.

Summary

A new method, Key Features Screening Method based on Extreme Learning Machine (KFS-ELM), effectively identifies crucial features for Alzheimer's disease (AD) diagnosis. This approach significantly improves diagnostic accuracy by focusing on the most impactful data points.