X-ray Crystallography
IR Spectrometers
X-ray Imaging
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Updated: Sep 8, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Peiyuan Guo1,2, Zhentian Wang1,2, Chengpeng Wu1,2
1Department of Engineering Physics, Tsinghua University, Beijing, China.
This study introduces a dual-shot X-ray grating interferometry method to reduce imaging time and complexity. The novel approach successfully retrieves high-quality signals, outperforming other single-shot techniques.
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