Reliability analysis for gap null gate based on model comparison criterion

Area of Science:

• Engineering
• Reliability Engineering
• Statistical Modeling

Background:

• The reliability of gap null gates is critically dependent on the gap length.
• Understanding the distribution of endpoint thresholds is essential for accurate reliability assessment.

Purpose of the Study:

• To develop statistical models for predicting successful responses based on gap length.
• To compare the suitability of Probit and Logit models for describing endpoint threshold distributions.
• To provide methods for point and interval estimation of the reliability window.

Main Methods:

• Modeling gap length endpoint thresholds as bivariate random variables.
• Utilizing score test statistics to assess correlation coefficients.
• Employing the Deviance Information Criterion (DIC) for model comparison.
• Implementing Probit and Logit models with experimental gap null gate data.

Main Results:

• The correlation coefficients in both Probit and Logit models were found to be statistically insignificant (approaching 0).
• The Probit model demonstrated a superior fit compared to the Logit model, as indicated by lower DIC values.
• Feasible point and interval estimations for the reliability window were successfully derived.

Conclusions:

• The Probit model is more appropriate for characterizing the distribution of endpoint thresholds in reliability windows.
• The proposed statistical framework effectively estimates the reliability of gap null gates.
• The study validates a novel approach to reliability analysis for gap null gate systems.