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Automatic Detection and Counting of Wheat Spikelet Using Semi-Automatic Labeling and Deep Learning.
Ruicheng Qiu1,2, Yong He1,2, Man Zhang3
1College of Biosystem Engineering and Food Science, Zhejiang University, Hangzhou, China.
Frontiers in Plant Science
|June 16, 2022
Summary
Automated wheat spikelet counting using imaging and deep learning significantly improves efficiency over manual methods. This technology aids in assessing wheat yield and understanding plant development characteristics.
Area of Science:
- Agricultural Science
- Plant Phenotyping
- Computational Biology
Background:
- Wheat spikelet number is a key trait for grain yield prediction.
- Manual spikelet counting is laborious and time-consuming.
- Efficient phenotyping methods are crucial for crop improvement.
Purpose of the Study:
- To develop an automated, cost-effective system for counting wheat spikelets.
- To utilize imaging processing and deep learning for accurate spikelet detection.
- To enhance the efficiency of wheat phenotyping.
Main Methods:
- Developed an unsupervised learning method for automatic spikelet detection and dataset creation.
- Employed transfer learning to retrain a deep convolutional neural network (CNN) for spikelet counting.
- Captured color images of wheat spikes during the grain-filling stage.
Main Results:
- The automated system demonstrated high accuracy in counting spikelets across four wheat lines.
- Quantitative metrics (RMSE, RRMSE, R²) indicate strong correlation between automated and manual counts.
- The developed methods effectively estimate spikelet numbers, improving counting efficiency.
Conclusions:
- The proposed imaging and deep learning approach provides an efficient solution for wheat spikelet counting.
- This automated phenotyping system aids in analyzing wheat spike developmental characteristics.
- The technology contributes to more accurate wheat yield assessment and breeding programs.

