Automatic Detection and Counting of Wheat Spikelet Using Semi-Automatic Labeling and Deep Learning.

Ruicheng Qiu1,2, Yong He1,2, Man Zhang3

  • 1College of Biosystem Engineering and Food Science, Zhejiang University, Hangzhou, China.

Summary

Automated wheat spikelet counting using imaging and deep learning significantly improves efficiency over manual methods. This technology aids in assessing wheat yield and understanding plant development characteristics.

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