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Electrically injected supersymmetric semiconductor lasers with narrow vertical divergence angle.

Ting Fu, Aiyi Qi, Jingxuan Chen

    Optics Letters
    |June 16, 2022
    PubMed
    Summary

    Electrically injected supersymmetric (SUSY) semiconductor lasers were fabricated using SUSY transformations. These lasers demonstrate excellent mode discrimination, favoring fundamental mode lasing with a single-lobe far-field pattern.

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    Area of Science:

    • Optoelectronics
    • Semiconductor physics
    • Laser technology

    Background:

    • Semiconductor lasers are crucial optoelectronic devices.
    • Achieving single-mode operation and high-quality beam patterns is a persistent challenge.
    • Supersymmetry (SUSY) transformations offer a novel approach to manipulate optical modes.

    Purpose of the Study:

    • To propose and fabricate electrically injected semiconductor lasers utilizing supersymmetry transformations.
    • To investigate the mode discrimination properties of SUSY semiconductor lasers.
    • To characterize the far-field emission pattern of the fabricated devices.

    Main Methods:

    • Applying two successive SUSY transformations to the main array along the epitaxial growth direction.
    • Designing the laser array to selectively remove specific propagation constants (fundamental and leaky modes).
    • Fabricating the proposed SUSY semiconductor laser structure.

    Main Results:

    • The SUSY transformations successfully removed the propagation constants of the fundamental and leaky modes.
    • The fabricated SUSY laser exhibited excellent mode discrimination, favoring fundamental mode lasing.
    • A single-lobe vertical far-field pattern with a 16.87° FWHM was achieved at 1.4 A injection current.

    Conclusions:

    • Electrically injected SUSY semiconductor lasers can effectively achieve superior mode discrimination.
    • The proposed SUSY approach enables preferential lasing of the fundamental mode.
    • The fabricated devices demonstrate potential for high-quality beam emission in optoelectronic applications.