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Updated: Sep 7, 2025

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Maxime Mollens1,2, Stéphane Roux2, François Hild2
1EDF R&D, Site des Renardières, 77818 Moret-sur-Loing, France.
This study introduces new quaternion-based image analysis methods for electron backscatter diffraction (EBSD) maps. These advanced techniques accurately segment and classify crystallographic phases in materials, improving quantitative metallography.
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Published on: July 14, 2022
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