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Updated: Sep 7, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
K Sasaki1, M Muramatsu2, K Hirayama1
1Department of Science for Open and Environmental Systems, Graduate School of Keio University, 3-14-1, Hiyoshi, Kohoku-ku, Kanagawa, 233-8522, Japan.
Researchers developed a new quantitative image analysis framework combining machine learning and particle filters to track nanoscale defects. This method accurately measures dislocation velocity in materials, overcoming limitations of traditional analysis techniques.
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07:02Studying the Effects of Temperature on the Nucleation and Growth of Nanoparticles by Liquid-Cell Transmission Electron Microscopy
Published on: February 17, 2021
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