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Design and Characterization Methodology for Efficient Wide Range Tunable MEMS Filters
Published on: February 4, 2018
Bing Qi1, Shuaishuai Shi1,2, Lin Zhao1
1College of Intelligent Systems Science and Engineering, Harbin Engineering University, Harbin 150001, China.
A new model precisely estimates MEMS accelerometer Temperature Drift Error (TDE) using microstructure thermal analysis and advanced AI. This significantly improves accuracy and reduces computational iterations for better performance in complex environments.
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