Updated: Sep 6, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Shi Zhao1, Jingye Chen1, Yaocheng Shi1
1State Key Laboratory for Modern Optical Instrumentation, Center for Optical and Electromagnetic Research, International Research Center for Advanced Photonics, Ningbo Research Institute, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, China.
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