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Updated: Sep 6, 2025

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
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A New Image Grating Sensor for Linear Displacement Measurement and Its Error Analysis.

Fang Cheng1, Dongfang Zhou1, Qing Yu1

  • 1College of Mechanical Engineering and Automation, Huaqiao University, Xiamen 361021, China.

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|June 24, 2022
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This study introduces an image grating system for precise, long-range linear displacement measurement. The novel system achieves high accuracy with minimal error, enhancing vision-based measurement capabilities.

Keywords:
displacement measurementerror analysisimage gratingphase correlationrange expansionvision-based

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Area of Science:

  • Metrology
  • Optical Measurement Systems
  • Image Processing

Background:

  • Vision-based systems are crucial for linear displacement measurement.
  • Existing methods face challenges in accuracy over large ranges.
  • Need for enhanced precision in displacement sensing.

Purpose of the Study:

  • To develop a novel image grating system for high-accuracy, large-range linear displacement measurement.
  • To improve upon the limitations of current vision-based measurement techniques.
  • To achieve sub-micrometer accuracy and high repeatability.

Main Methods:

  • Utilized a patterned glass plate and an ultra-low distortion lens.
  • Employed a DFT local up-sampling phase correlation method for sub-pixel translation detection.
  • Implemented multiple stripe patterns and dynamic calibration for nonlinear error compensation.

Main Results:

  • Achieved a total measurement error of less than 2.5 μm over a 60 mm range.
  • Demonstrated high repeatability within 0.16 μm (standard deviation).
  • Successfully compensated for nonlinear errors through dynamic pixel equivalent calibration.

Conclusions:

  • The proposed image grating system significantly enhances linear displacement measurement accuracy and range.
  • The system offers a robust solution for applications requiring precise motion tracking.
  • Error compensation strategies are vital for achieving sub-micrometer precision in optical metrology.