Scanning Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Overview of Electron Microscopy
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In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
Batuhan Yildirim1,2,3, Adam Washington2, James Doutch2
1Cavendish Laboratory, Department of Physics, University of Cambridge J. J. Thomson Avenue Cambridge CB3 0HE UK jmc61@cam.ac.uk.
This study presents a method to derive small-angle scattering (SAS) intensity functions from 2D electron microscopy (EM) images. The approach is validated against experimental data, offering a complementary tool for SAS analysis.
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