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Updated: Sep 6, 2025

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
Multi-scale electronics transport properties in non-ideal CVD graphene sheet
Bhupesh Bishnoi1, Marius Buerkle2, Hisao Nakamura2
1National Institute of Advanced Industrial Science and Technology (AIST), Research Center for Computational Design of Advanced Functional Materials (CD-FMat), Central 2, Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan. bishnoi.bhupesh@aist.go.jp.
Simulating distorted graphene sheets reveals that surface corrugation significantly impacts electronic properties, creating charge puddles. This study benchmarks non-idealities in graphene devices for improved electrical performance.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Graphene's unique electronic properties are sensitive to structural imperfections.
- Surface corrugation and substrate interactions are common non-idealities in fabricated graphene devices.
- Understanding these variations is crucial for reliable graphene-based electronics.
Purpose of the Study:
- To benchmark the effects of structural non-idealities, specifically surface and in-plane corrugations, on graphene device performance.
- To investigate how random distortions influence electronic properties like density of states and charge distribution.
- To elucidate the impact of impurities on charge scattering in corrugated graphene.
Main Methods:
- Simulated over 200 graphene-based device structures using the non-equilibrium Green's function (NEGF) framework.
- Introduced random, inhomogeneous, and asymmetric corrugations (out-of-plane and in-plane) via autocorrelation functions.
- Examined variations in density of states, transmission modes, band structure, and charge densities, including impurity effects.
Main Results:
- Surface corrugation leads to increased variation in electronic and hole density distribution.
- Observed the formation of electron-hole charge puddles due to corrugation-induced symmetry breaking and quantum fluctuations.
- Simulated impurity effects to understand their impact on scattered charge distribution.
Conclusions:
- Structural non-idealities like corrugation significantly alter graphene's electronic landscape, creating localized charge puddles.
- The NEGF framework effectively models these effects, providing insights into device performance variations.
- Benchmarking various device morphologies and material compositions is essential for optimizing graphene electronic devices.
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