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ArtSeg-Artifact segmentation and removal in brightfield cell microscopy images without manual pixel-level annotations
Mohammed A S Ali1, Kaspar Hollo1, Tõnis Laasfeld2
1Department of Computer Science, University of Tartu, Narva mnt 18, 51009, Tartu, Estonia.
We developed ScoreCAM-U-Net, a deep learning model that efficiently removes visual artifacts from brightfield microscopy images using image-level labels, improving downstream analysis accuracy.
Area of Science:
- Life Sciences
- Biotechnology
- Medical Imaging
Background:
- Brightfield microscopy is crucial in life sciences but images often contain artifacts.
- These artifacts impede accurate downstream analyses like cell segmentation and quantification.
- Current artifact removal methods often require laborious pixel-level annotations.
Purpose of the Study:
- To introduce ScoreCAM-U-Net, a novel deep learning pipeline for automated artifact segmentation in brightfield microscopy images.
- To enable efficient artifact removal with minimal user input, utilizing image-level labels instead of pixel-level annotations.
- To demonstrate the effectiveness of automated artifact removal in improving the reliability of subsequent image analyses.
Main Methods:
- Development of the ScoreCAM-U-Net architecture, a deep convolutional neural network.
- Training the model using image-level labels for artifact presence/absence, significantly reducing annotation time.
- Validation of the model on three distinct brightfield microscopy datasets with diverse artifact types.
Main Results:
- ScoreCAM-U-Net successfully segments artifactual regions in brightfield images with high performance.
- The model's training process is orders of magnitude faster than traditional pixel-level annotation methods.
- Automated artifact removal demonstrably improved accuracy in nuclei segmentation, morphometry, and fluorescence intensity quantification.
Conclusions:
- ScoreCAM-U-Net offers a rapid and effective solution for artifact removal in brightfield microscopy.
- The use of image-level labels makes deep learning-based artifact segmentation more accessible and scalable.
- This automated approach is poised to become an essential step in large-scale microscopy experiments for enhanced data integrity.
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